JPH0197263U - - Google Patents

Info

Publication number
JPH0197263U
JPH0197263U JP19269187U JP19269187U JPH0197263U JP H0197263 U JPH0197263 U JP H0197263U JP 19269187 U JP19269187 U JP 19269187U JP 19269187 U JP19269187 U JP 19269187U JP H0197263 U JPH0197263 U JP H0197263U
Authority
JP
Japan
Prior art keywords
package
measurement probe
probe assembly
utility
model registration
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP19269187U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0533974Y2 (en]
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP19269187U priority Critical patent/JPH0533974Y2/ja
Publication of JPH0197263U publication Critical patent/JPH0197263U/ja
Application granted granted Critical
Publication of JPH0533974Y2 publication Critical patent/JPH0533974Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
JP19269187U 1987-12-21 1987-12-21 Expired - Lifetime JPH0533974Y2 (en])

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19269187U JPH0533974Y2 (en]) 1987-12-21 1987-12-21

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19269187U JPH0533974Y2 (en]) 1987-12-21 1987-12-21

Publications (2)

Publication Number Publication Date
JPH0197263U true JPH0197263U (en]) 1989-06-28
JPH0533974Y2 JPH0533974Y2 (en]) 1993-08-27

Family

ID=31483531

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19269187U Expired - Lifetime JPH0533974Y2 (en]) 1987-12-21 1987-12-21

Country Status (1)

Country Link
JP (1) JPH0533974Y2 (en])

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006261144A (ja) * 2005-03-15 2006-09-28 Minowa Koa Inc 抵抗器の製造法及び抵抗器の検測装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006261144A (ja) * 2005-03-15 2006-09-28 Minowa Koa Inc 抵抗器の製造法及び抵抗器の検測装置

Also Published As

Publication number Publication date
JPH0533974Y2 (en]) 1993-08-27

Similar Documents

Publication Publication Date Title
KR880008033A (ko) Ic 칩 테스트 장치
JPH0197263U (en])
JPH0197262U (en])
JPH0611464Y2 (ja) 抵抗測定用プローブ
JPH0445971U (en])
JPH08179003A (ja) 表面実装部品測定端子取付器
JPH0210462Y2 (en])
JPH031822Y2 (en])
JPH0742140Y2 (ja) プローブのアース構造
JPS5828360Y2 (ja) Icクリツプ
KR200300719Y1 (ko) 계측기용 단자 체결구조
JPS60161865U (ja) 回路測定ブロ−ブ
JPH0195672U (en])
JPH02130475A (ja) 探針
KR200227339Y1 (ko) 반도체 측정장비
JPS6267481U (en])
JPS58134775U (ja) Ic測定クリツプ
JPS6013477U (ja) フラツトケ−ブルの素線配列順序検査治具
JPS6231974A (ja) Ic用ソケツト
JPS63199071U (en])
JPS61162758A (ja) インサ−キツトテスタの測定ノ−ド中継装置
JPH0461310B2 (en])
JPS6265568U (en])
JPS61178482U (en])
JPH04126174U (ja) プローブの構造